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DEUjerumani·Mnunuzi: IHP GmbH - Leibniz-Institut für innovative Mikroelektronik

Semi-automatic prober for characterization of 200 mm wafers

Wazi kwa zabuni·13 Sep 2026

Supply, delivery, installation, commissioning and integration of a semi-automatic wafer prober system for the electrical and temperature-dependent characterization of 200 mm wafers. The system shall support DC and pulsed I-V as well as low-frequency impedance measurements up to 10 MHz and shall be integrated with the existing Keithley 4200A-SCS characterization system. The scope includes the prober, temperature-controlled chuck, electrical probes, optical and camera systems, control hardware and software, cabling and interfaces, installation, commissioning, operator training and integration support.

Imechapishwa

13.09.2026

Wazi kwa zabuni

13.09.2026

Mwisho wa muda

13.10.2026

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