Niemcy·Zamawiający: IHP GmbH - Leibniz-Institut für innovative Mikroelektronik

Semi-automatic prober for characterization of 200 mm wafers

Zamknięte·13 wrz 2026

Supply, delivery, installation, commissioning and integration of a semi-automatic wafer prober system for the electrical and temperature-dependent characterization of 200 mm wafers. The system shall support DC and pulsed I-V as well as low-frequency impedance measurements up to 10 MHz and shall be integrated with the existing Keithley 4200A-SCS characterization system. The scope includes the prober, temperature-controlled chuck, electrical probes, optical and camera systems, control hardware and software, cabling and interfaces, installation, commissioning, operator training and integration support.

Opublikowano

13.09.2026

Przyjmowanie ofert

13.09.2026

Termin

13.10.2026

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