DTU requires the supply, delivery, installation, commissioning and acceptance of one (1) focused ion beam scanning electron microscope (FIB-SEM) dual-beam platform. The instrument shall serve a multi-user research environment and will be used for high-resolution surface imaging, site-specific cross-sectioning, TEM lamella preparation (including automated workflows), 3D FIB-SEM tomography, gas-assisted deposition and etching, nanoscale manipulation, and elemental microanalysis by energy-dispersive X-ray spectroscopy (EDS) and ToF-SIMS.
Publisert
15.10.2026
Åpen for tilbud
15.10.2026
Frist
16.11.2026
Intelligent styresystem til global mobility compliance
Tildelt·Oct 14
Delivery and installation of a ICP Reactive ion etcher for silicon dielctrics
Åpen for tilbud·Oct 12
Integrated Tunable Laser Platform with Wavelength Stabilisation for photonic integrated circuit
Tildelt·Oct 12
Værktøjsudbud (1)
Tildelt·Oct 12
Indsamling og behandling af affald
Åpen for tilbud·Oct 8
Purchase of high repetition rate mode locked fiber laser
Tildelt·Oct 8
Supplier qualification system for Valve Supply Contracts concerning the Danish Hydrogen Backbone - 26/23313
Åpen for tilbud·Oct 21
TLA løsning til Præanalyse, Koagulation og Mikrobiologi på KB Rigshospitalet
Åpen for tilbud·Oct 21
Topic Centre on Chemicals, Environment and Health
Åpen for tilbud·Oct 21
IHC Farvninger, Udstyr og udstyrsspecifikke forbrugsvarer
Åpen for tilbud·Oct 21
Teknisk høring / Udbud af Rehabiliteringsydelser på specialiseret niveau
Planlegging·Oct 21
EU-udbud vedr. Levering af grov arbejdsbeklædning og sikkerhedsfodtøj til Aalborg Kommune
Åpen for tilbud·Oct 21
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