Publié
24.08.2026
Ouvert aux offres
24.08.2026
Date limite
08.09.2026
ACAN 26-58022 Automated Wafer Defect Inspection System and ICP Plasma Processing Module
ACAN 26-58022 Automated Wafer Defect Inspection System and ICP Plasma Processing Module
ACAN 25-58272 Automated Linear Multi-Module WaferTrack System
A supply of 3" Indium Phosphide prime grade wafers and 3" and 4” ultra-flat Silicon wafers prime grade wafers
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